Contactless Conductivity Measurement: Difference between revisions

From PC5214 wiki
Jump to navigation Jump to search
E0732931 (talk | contribs)
E0732931 (talk | contribs)
Line 1: Line 1:
==Introduction==
==Introduction==


Although it is convenient to measure conductivity using Conductivity Meter, surface preparation and contamination have great effects on the electrical properties of the samples. Thus, a contactless technic would be a better way to carry out the conductivity measurement.
In our Spintronics Lab, when we want to analyze a sample, conductivity or resistivity as a electrical property is almost always necessary. Normally, we use a Voltmeter or standard four probes method to take a measurement. However, surface preparation and contamination have great effects on the electrical properties of the samples. Thus, a contactless technic would be a better way to carry out the conductivity measurement. When we were doing the ac magnetic susceptibility measurement, we learn from literature that there is connection between the electrical conductivity and the ac magnetic susceptibility. We would like to build the set up from the literature, take a measurement on the conductivity of our semiconductor sample and compare it with the result from standard four probes measurement.


==Theory==
==Theory==

Revision as of 14:56, 28 April 2022

Introduction

In our Spintronics Lab, when we want to analyze a sample, conductivity or resistivity as a electrical property is almost always necessary. Normally, we use a Voltmeter or standard four probes method to take a measurement. However, surface preparation and contamination have great effects on the electrical properties of the samples. Thus, a contactless technic would be a better way to carry out the conductivity measurement. When we were doing the ac magnetic susceptibility measurement, we learn from literature that there is connection between the electrical conductivity and the ac magnetic susceptibility. We would like to build the set up from the literature, take a measurement on the conductivity of our semiconductor sample and compare it with the result from standard four probes measurement.

Theory

Equations

To do list

Prepare the samples

Prepare the coils

Build the experimental set up

Measure

Graph and Report

Sample Preparation

Experiment Set up

Data Analysis

Conclusion

Team Members

Chen Guohao, Jiang Luwen

Lab Location

Spintronics and Magnetic Materials Lab

Sources

Bean, C. P., DeBlois, R. W., & Nesbitt, L. B. (1959). Eddy‐Current method for measuring the resistivity of metals. Journal of Applied Physics, 30(12), 1976-1980. https://doi.org/10.1063/1.1735100​

Crowley, J. D., & Rabson, T. A. (1976). Contactless method of measuring resistivity. Review of Scientific Instruments, 47(6), 712-715. https://doi.org/10.1063/1.1134714​

Oike, H., Miyagawa, K., Kanoda, K., Taniguchi, H., & Murata, K. (2009). Contactless conductivity measurements on the organic conductor, κ-(ET)4Hg2.89Br8, under pressure. Physica. B, Condensed Matter, 404(3-4), 376-378. https://doi.org/10.1016/j.physb.2008.11.023

Ishida, T., Monden, K., & Nakada, I. (1986). Electrodeless method for the measurement of ionic conductivity of RbAg4I5. Review of Scientific Instruments, 57(12), 3081-3084. https://doi.org/10.1063/1.1138995