Contactless Conductivity Measurement: Difference between revisions
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==Introduction== | ==Introduction== | ||
In our Spintronics Lab, when we want to analyze a sample, conductivity or resistivity as a electrical property is almost always necessary. Normally, we use a Voltmeter or standard four probes method to take a measurement. However, surface preparation and contamination have great effects on the electrical properties of the samples. Thus, a contactless technic would be a better way to carry out the conductivity measurement. When we were doing the ac magnetic susceptibility measurement, we learn from literature that there is connection between the electrical conductivity and the ac magnetic susceptibility. We would like to build the set up from the literature, take a measurement on the conductivity of our semiconductor sample and compare it with the result from standard four probes measurement. | |||
==Theory== | ==Theory== |
Revision as of 14:56, 28 April 2022
Introduction
In our Spintronics Lab, when we want to analyze a sample, conductivity or resistivity as a electrical property is almost always necessary. Normally, we use a Voltmeter or standard four probes method to take a measurement. However, surface preparation and contamination have great effects on the electrical properties of the samples. Thus, a contactless technic would be a better way to carry out the conductivity measurement. When we were doing the ac magnetic susceptibility measurement, we learn from literature that there is connection between the electrical conductivity and the ac magnetic susceptibility. We would like to build the set up from the literature, take a measurement on the conductivity of our semiconductor sample and compare it with the result from standard four probes measurement.
Theory
Equations
To do list
Prepare the samples
Prepare the coils
Build the experimental set up
Measure
Graph and Report
Sample Preparation
Experiment Set up
Data Analysis
Conclusion
Team Members
Chen Guohao, Jiang Luwen
Lab Location
Spintronics and Magnetic Materials Lab
Sources
Bean, C. P., DeBlois, R. W., & Nesbitt, L. B. (1959). Eddy‐Current method for measuring the resistivity of metals. Journal of Applied Physics, 30(12), 1976-1980. https://doi.org/10.1063/1.1735100
Crowley, J. D., & Rabson, T. A. (1976). Contactless method of measuring resistivity. Review of Scientific Instruments, 47(6), 712-715. https://doi.org/10.1063/1.1134714
Oike, H., Miyagawa, K., Kanoda, K., Taniguchi, H., & Murata, K. (2009). Contactless conductivity measurements on the organic conductor, κ-(ET)4Hg2.89Br8, under pressure. Physica. B, Condensed Matter, 404(3-4), 376-378. https://doi.org/10.1016/j.physb.2008.11.023
Ishida, T., Monden, K., & Nakada, I. (1986). Electrodeless method for the measurement of ionic conductivity of RbAg4I5. Review of Scientific Instruments, 57(12), 3081-3084. https://doi.org/10.1063/1.1138995